Title :
Fault Isolation Technique Cuts Testing Costs
Author_Institution :
Computer Automation,Inc.,Irvine, CA
fDate :
3/1/1976 12:00:00 AM
Keywords :
Automatic testing; Integrated circuit testing; Logic circuit fault diagnosis; Printed circuits; Production testing; Semiconductor device economies; Automatic testing; Circuit faults; Circuit testing; Costs; Logic circuits; Logic testing; Manufacturing; Performance evaluation; Printed circuits; System testing;
Journal_Title :
Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TMFT.1976.1136014
