Author :
Crebs, R. ; Thornhill, D.
Author_Institution :
Westinghouse A.T.L.,Baltimore, MD
fDate :
3/1/1976 12:00:00 AM
Abstract :
The test operation is normally limited to the smallest number of tests that effectively measure the ability of the device to meet or exceed a set of reliability and performance criteria. Diagnostic testing, on the other hand, attempts to characterize the device in order to identify fault mechanisms to provide feedback for yield and/or performance improvement. Utilization of the capabilities of computercontrolled automatic test equipment can generate and reduce data to provide meaningful diagnostic feedback while maintaining production throughput.
Keywords :
Automatic testing; Semiconductor device testing; Circuit testing; Companies; Control systems; Costs; Feedback; Financial management; Hybrid integrated circuits; Integrated circuit interconnections; Resistors; Solid state circuits;
Journal_Title :
Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TMFT.1976.1136016
