DocumentCode
963128
Title
Analysis of Electronic Component Screening Programs and Their Cost Effectiveness
Author
Schuster, Robert ; Fischer, Ray
Volume
5
Issue
2
fYear
1976
fDate
6/1/1976 12:00:00 AM
Firstpage
37
Lastpage
43
Abstract
A detailed analysis of screening tests of integrated circuits, transistors, and diodes is presented. Included is a cost-effectiveness study of various types of "screens."
Keywords
Semiconductor device economies; Semiconductor device reliability; Semiconductor device testing; Aerospace testing; Assembly; Associate members; Circuit testing; Costs; Diodes; Electronic components; Helium; Integrated circuit testing; Laboratories;
fLanguage
English
Journal_Title
Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0046-838X
Type
jour
DOI
10.1109/TMFT.1976.1136024
Filename
1136024
Link To Document