Title :
Analysis of Electronic Component Screening Programs and Their Cost Effectiveness
Author :
Schuster, Robert ; Fischer, Ray
fDate :
6/1/1976 12:00:00 AM
Abstract :
A detailed analysis of screening tests of integrated circuits, transistors, and diodes is presented. Included is a cost-effectiveness study of various types of "screens."
Keywords :
Semiconductor device economies; Semiconductor device reliability; Semiconductor device testing; Aerospace testing; Assembly; Associate members; Circuit testing; Costs; Diodes; Electronic components; Helium; Integrated circuit testing; Laboratories;
Journal_Title :
Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TMFT.1976.1136024
