Title :
The Relation between Effective Resistance and Frequency in Radio Telegraphic Condensers
Author :
Austin, Louis W.
Author_Institution :
Head of the United States Naval Radiotelegraphic Laboratory
fDate :
4/1/1913 12:00:00 AM
Keywords :
Circuit testing; Conductivity; Dielectric losses; Electrical resistance measurement; Energy loss; Frequency; Glass; Switches; Switching circuits; Voltage;
Journal_Title :
Radio Engineers, Proceedings of the Institute of
DOI :
10.1109/JRPROC.1913.216580
