Title :
A Unified View of Test Compression Methods
Author :
Robinson, John P. ; Saxena, Nirmal R.
Author_Institution :
Department of Electrical and Computer Engineering, University of Iowa, Iowa City, IA 52242.
Abstract :
A unified treatment of the various techniques to reduce the output data from a unit under test is given. The characteristics of time compression schemes with respect to errors detected are developed. The use of two or more of these methods together is considered. Methods to design efficient test compression structures for built-in-tests are proposed. The feasibility of the proposed approach is demonstrated by simulation results.
Keywords :
Automatic testing; Built-in self-test; Circuit testing; Counting circuits; Feedback; Logic testing; Polynomials; Read only memory; Shift registers; Test pattern generators; Built-in test; Walsh spectral coefficients; data compaction; data compression; self-test; signature analysis; syndrome testing;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1987.5009452
