DocumentCode
963169
Title
A Unified View of Test Compression Methods
Author
Robinson, John P. ; Saxena, Nirmal R.
Author_Institution
Department of Electrical and Computer Engineering, University of Iowa, Iowa City, IA 52242.
Issue
1
fYear
1987
Firstpage
94
Lastpage
99
Abstract
A unified treatment of the various techniques to reduce the output data from a unit under test is given. The characteristics of time compression schemes with respect to errors detected are developed. The use of two or more of these methods together is considered. Methods to design efficient test compression structures for built-in-tests are proposed. The feasibility of the proposed approach is demonstrated by simulation results.
Keywords
Automatic testing; Built-in self-test; Circuit testing; Counting circuits; Feedback; Logic testing; Polynomials; Read only memory; Shift registers; Test pattern generators; Built-in test; Walsh spectral coefficients; data compaction; data compression; self-test; signature analysis; syndrome testing;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1987.5009452
Filename
5009452
Link To Document