DocumentCode :
963181
Title :
Reliability Improvements in Commercial/Industrial Grade Integrated Circuit Devices
Author :
Hawkins, Raymond
Author_Institution :
Fairchild Semiconductor,Mt.View, CA
Volume :
5
Issue :
3
fYear :
1976
fDate :
9/1/1976 12:00:00 AM
Firstpage :
58
Lastpage :
61
Keywords :
Integrated circuit reliability; Integrated circuit testing; Reliability testing; Ceramics; Costs; Integrated circuit reliability; Life estimation; Life testing; Materials testing; Packaging; Plastics; System testing; Thermal stresses;
fLanguage :
English
Journal_Title :
Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0046-838X
Type :
jour
DOI :
10.1109/TMFT.1976.1136029
Filename :
1136029
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=963181
بازگشت