DocumentCode
963286
Title
Pulse measurements of transient thermal response and temperature of avalanching p¿n junction
Author
Nigrin, J.
Author_Institution
University of Alberta, Department of Electrical Engineering, Edmonton, Canada
Volume
7
Issue
17
fYear
1971
Firstpage
481
Lastpage
483
Abstract
A method is presented for measuring the junction temperature and the transient thermal response of oscillator-mounted avalanche diodes; the method requires an exact knowledge of the temperature dependence of the diode breakdown voltage. The junction temperature can be measured with unchanged accuracy within the measured temperature range of the breakdown voltage. The transient response as close as a few microseconds after the initiation of the junction-temperature step can be measured.
Keywords
avalanche diodes; p-n junctions; temperature measurement; thermal effects; transients; avalanche diodes; breakdown voltage; oscillator heatsink; p-n junction; temperature measurement; thermal effect; transient response;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19710326
Filename
4244932
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