DocumentCode :
963286
Title :
Pulse measurements of transient thermal response and temperature of avalanching p¿n junction
Author :
Nigrin, J.
Author_Institution :
University of Alberta, Department of Electrical Engineering, Edmonton, Canada
Volume :
7
Issue :
17
fYear :
1971
Firstpage :
481
Lastpage :
483
Abstract :
A method is presented for measuring the junction temperature and the transient thermal response of oscillator-mounted avalanche diodes; the method requires an exact knowledge of the temperature dependence of the diode breakdown voltage. The junction temperature can be measured with unchanged accuracy within the measured temperature range of the breakdown voltage. The transient response as close as a few microseconds after the initiation of the junction-temperature step can be measured.
Keywords :
avalanche diodes; p-n junctions; temperature measurement; thermal effects; transients; avalanche diodes; breakdown voltage; oscillator heatsink; p-n junction; temperature measurement; thermal effect; transient response;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19710326
Filename :
4244932
Link To Document :
بازگشت