• DocumentCode
    963286
  • Title

    Pulse measurements of transient thermal response and temperature of avalanching p¿n junction

  • Author

    Nigrin, J.

  • Author_Institution
    University of Alberta, Department of Electrical Engineering, Edmonton, Canada
  • Volume
    7
  • Issue
    17
  • fYear
    1971
  • Firstpage
    481
  • Lastpage
    483
  • Abstract
    A method is presented for measuring the junction temperature and the transient thermal response of oscillator-mounted avalanche diodes; the method requires an exact knowledge of the temperature dependence of the diode breakdown voltage. The junction temperature can be measured with unchanged accuracy within the measured temperature range of the breakdown voltage. The transient response as close as a few microseconds after the initiation of the junction-temperature step can be measured.
  • Keywords
    avalanche diodes; p-n junctions; temperature measurement; thermal effects; transients; avalanche diodes; breakdown voltage; oscillator heatsink; p-n junction; temperature measurement; thermal effect; transient response;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19710326
  • Filename
    4244932