DocumentCode :
963485
Title :
Computer-Controlled Life Test System for Dry Reed Sealed Contacts
Author :
Dickerhoff, Robert L., Jr. ; Renault, Paul W.
Author_Institution :
Bell Telephone Laboratories,Inc.,Columbus, OH
Volume :
5
Issue :
1
fYear :
1969
fDate :
3/1/1969 12:00:00 AM
Firstpage :
25
Lastpage :
37
Abstract :
New techniques for obtaining and processing resistance, sticking, and sensitivity data for dry reed sealed contacts via a real-time data system are described. The system consists of a small digital computers an acquisition subsystem with an expandable capacity of 114 contacts, a magnetic disc mass memory, and a plotter. A description of data collection, reduction, storage, and presentation is included, and analysis techniques are discussed. The results of actual tests run with this system are presented and compared with results of tests run with other, less sophisticated, test sets.
Keywords :
Circuits; Contact resistance; Data systems; Electronic switching systems; Frequency; Life testing; Real time systems; Speech; Switches; System testing;
fLanguage :
English
Journal_Title :
Parts, Materials and Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9502
Type :
jour
DOI :
10.1109/TPMP.1969.1136057
Filename :
1136057
Link To Document :
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