Title :
Wavelet-based representations for the 1/f family of fractal processes
Author :
Wornell, Gregory W.
Author_Institution :
Res. Lab. of Electron., MIT, Cabridge, MA, USA
fDate :
10/1/1993 12:00:00 AM
Abstract :
It is demonstrated that 1/f fractal processes are, in a broad sense, optimally represented in terms of orthonormal wavelet bases. Specifically, via a useful frequency-domain characterization for 1/f processes, the wavelet expansion´s role as a Karhunen-Loeve-type expansion for 1/f processes is developed. As an illustration of potential, it is shown that wavelet-based representations naturally lead to highly efficient solutions to some fundamental detection and estimation problems involving 1/f processes
Keywords :
fractals; random noise; signal detection; wavelet transforms; 1/f family; Karhunen-Loeve-type expansion; estimation problems; fractal processes; frequency-domain characterization; orthonormal wavelet bases; signal detection; Brownian motion; Context modeling; Earthquake engineering; Fractals; Geometry; Random processes; Signal processing; Signal processing algorithms; Signal synthesis; Wavelet domain;
Journal_Title :
Proceedings of the IEEE