DocumentCode :
963808
Title :
InGaAs superconducting JFETs with Nb electrodes
Author :
Kleinsasser, A.W. ; Jackson, Thomas N. ; McInturff, D. ; Rammo, F. ; Woodall, Jerry M.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Volume :
36
Issue :
11
fYear :
1989
fDate :
11/1/1989 12:00:00 AM
Firstpage :
2628
Abstract :
Summary form only given. The authors have fabricated InGaAs junction FETs with Nb source and drain electrodes with submicrometer spacings. The devices exhibit gate-controlled supercurrents as large as 8 mA/mm at 4.2 K. This value of controlled supercurrent is larger than any previously reported for superconducting field-effect devices. The channel material was n-type In0.53Ga0.47As, epitaxially grown by molecular beam epitaxy on InP substrates. Gate control was achieved using a p-n junction which was buried below the channel. This structure allowed the Nb superconductor to be deposited directly onto the freshly grown channel layer to insure a clean superconductor-semiconductor contact, which is essential for obtaining optimum superconducting properties. The superconducting electrodes were patterned by reactive ion etching.
Keywords :
III-V semiconductors; gallium arsenide; indium compounds; junction gate field effect transistors; substrates; superconducting junction devices; 4.2 K; InGaAs-Nb; InP substrates; Nb electrodes; gate-controlled supercurrents; junction FETs; molecular beam epitaxy; p-n junction; reactive ion etching; semiconductors; submicrometer spacings; superconducting JFETs; superconducting field-effect devices; superconductor-semiconductor contact; Electrodes; Indium gallium arsenide; Indium phosphide; JFETs; Josephson junctions; Molecular beam epitaxial growth; Niobium; Superconducting devices; Superconducting epitaxial layers; Superconducting materials;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.43757
Filename :
43757
Link To Document :
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