DocumentCode :
963825
Title :
A single-chip SQUID having an improved superconducting storage-loop
Author :
Fujimaki, N. ; Tamura, H. ; Suzuki, Hajime ; Imamura, Takashi ; Hasuo, S. ; Shibatomi, A.
Author_Institution :
Fujitsu Labs. Ltd., Atsugi, Japan
Volume :
36
Issue :
11
fYear :
1989
fDate :
11/1/1989 12:00:00 AM
Firstpage :
2628
Lastpage :
2629
Abstract :
Summary form only given. The authors have previously (1988) integrated both a SQUID (superconducting quantum interference device) sensor and a superconducting feedback circuit on a single chip. In the present work, the authors describe the improvement of the dynamic range of the single-chip SQUID by more than two orders of magnitude; high sensitivity was also obtained. In the single-chip SQUID, the sensor is AC biased and produces a pulse sequence. The superconducting feedback circuit consists of a superconducting loop and a write gate, a two-junction interferometer. The gate adds a flux quantum to the loop when it receives a pulse from the sensor. The stored flux is fed back to the sensor through magnetical coupling. When a large input was applied, the loop stored flux quanta up to +or-2*104. This number is more than two orders of magnitude larger than the previous value, +or-102; however, it is reduced from the design value, +or-1.5*105. This reduction is due to the circulating current in the loop caused by the flux trappings.
Keywords :
SQUIDs; AC biased; dynamic range; flux quantum; flux trappings; loop stored flux quanta; magnetical coupling; pulse sequence; sensitivity; single-chip SQUID; superconducting feedback circuit; superconducting quantum interference device; superconducting storage-loop; two-junction interferometer; write gate; Coupling circuits; Dynamic range; Electrical resistance measurement; Feedback circuits; Interference; Magnetic flux; Magnetic sensors; Niobium; Optical films; Optical interconnections; Optical surface waves; Optical waveguides; SQUIDs; Superconducting devices; Superconducting films; Superconducting magnets; Surface resistance; Yttrium barium copper oxide;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.43759
Filename :
43759
Link To Document :
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