DocumentCode :
963836
Title :
Evaluating the Thermal Stability and Radiation Resistance of Silicone Dielectrics
Author :
Christensen, D.F.
Author_Institution :
Dow Corning Corp., Mich
Volume :
5
Issue :
2
fYear :
1958
fDate :
6/1/1958 12:00:00 AM
Firstpage :
108
Lastpage :
115
Abstract :
This paper, directed toward the designers of electronic equipment, deals with the aspects of thermal stability and radiation resistance of silicone dielectrics. Information is included which indicates how designers can utilize the maximum thermal stability and radiation resistance inherent in the silicone molecule. It points out that the useful life of silicone electrical insulation subjected to these environments is largely dependent upon physical rather than electrical property changes.
Keywords :
Chemicals; Dielectric materials; Dielectrics and electrical insulation; Electric resistance; Oxidation; Polymers; Resins; Temperature; Thermal resistance; Thermal stability;
fLanguage :
English
Journal_Title :
Component Parts, IRE Transactions on
Publisher :
ieee
ISSN :
0096-2422
Type :
jour
DOI :
10.1109/TCP.1958.1136093
Filename :
1136093
Link To Document :
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