• DocumentCode
    963889
  • Title

    Character of Insulator Surface Leakage at High Humidity

  • Author

    Chaikin, S.W. ; Church, F.M.

  • Author_Institution
    Stanford Res. Inst., Calif
  • Volume
    5
  • Issue
    4
  • fYear
    1958
  • fDate
    12/1/1958 12:00:00 AM
  • Firstpage
    153
  • Lastpage
    156
  • Abstract
    Dissipation of leakage power in the surface film of water on an insulator at high humidity is thought to cause the observed improvement in surface resistance by elevating the temperature and evaporating part of the water. Surface resistance of a printed circuit test pattern varied from 0.3 to over 3000 megohms in response to the magnitude of electrical potential applied (5 to 400 volts) and the cleanliness of the sample. In addition to such gradual changes, oscilloscopic observation revealed transient changes, possibly arising from sudden shifting of current paths from one area to another in the surface film of water. Contamination produced transient reductions in resistance as great as 50 per cent. With clean samples, less pronounced and less frequent variations in resistance were observed.
  • Keywords
    Circuit testing; Electric potential; Electric resistance; Humidity; Insulation; Printed circuits; Surface cleaning; Surface contamination; Surface resistance; Temperature;
  • fLanguage
    English
  • Journal_Title
    Component Parts, IRE Transactions on
  • Publisher
    ieee
  • ISSN
    0096-2422
  • Type

    jour

  • DOI
    10.1109/TCP.1958.1136099
  • Filename
    1136099