Title :
A Note on Strongly Fault-Secure Sequential Circuits
Author :
Nanya, Takashi ; Kawamura, Toshiaki
Author_Institution :
Department of Computer Science, Tokyo Institute of Technology, Tokyo, 152 Japan.
Abstract :
It is proved that any sequential circuit with its next-state function d and output function w is strongly fault secure for unidirectional faults in d and w if i) the outputs of w are encoded in an unordered code, and ii) d and w are implemented with inverter-free circuits.
Keywords :
Built-in self-test; Circuit faults; Combinational circuits; Design methodology; Electrical fault detection; Encoding; Fault detection; Feedback circuits; Logic circuits; Sequential circuits; Concurrent fault detection; fail-safe; sequential circuits; strongly fault secure; totally self-checking;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1987.5009545
