DocumentCode
964161
Title
The Economics and Reliability of Multifunction Devices
Author
Davies, J.A. ; Mccool, C.D.
Author_Institution
Receiving Tube Dept., General Electric Co., Owensboro, Ky.
Issue
2
fYear
1961
Firstpage
42
Lastpage
52
Abstract
The widely prevalent assumption that device failure rates are multiplied when two or more functions are incorporated In a single enclosure is examined with respect to actual experience on single-element vs multiple-element electron tubes. The feasibility and economics of multi-element structures are considered in the light of the recent trend toward greater and greater complexity of device combinations. The natural limits to this trend are predicted by extrapolating known factors related to spread of characteristics, random catastrophic failures, and life. Some of the most recent examples of this philosophy are described and discussed in comparison to earlier versions providing similar functional performance.
Keywords
Business; Costs; Economic forecasting; Electron tubes; Electronics industry; Industrial electronics; Pins; Power generation economics; Space heating; TV;
fLanguage
English
Journal_Title
Reliability and Quality Control, IRE Transactions on
Publisher
ieee
ISSN
0097-4552
Type
jour
DOI
10.1109/IRE-PGRQC.1961.5009562
Filename
5009562
Link To Document