DocumentCode :
964300
Title :
Testing of digital systems
Author :
Siewiorek, Daniel P. ; Lai, Larry Kwok-Woon
Author_Institution :
Carnegie-Mellon University, Pittsburgh, PA
Volume :
69
Issue :
10
fYear :
1981
Firstpage :
1321
Lastpage :
1333
Abstract :
This paper is intended to be both a tutorial on hardware testing and a brief survey of existing techniques. Testing is discussed at all levels in the digital system hierarchy as well as at every stage of a system\´s life. The paper is organized into three parts. In the first part, fundamental concepts are presented. The second part reviews various testing techniques, with special emphasis on those that have gained wide acceptance. Finally, design techniques which promise to produce "easily testable" hardware are explored.
Keywords :
Circuit faults; Counting circuits; Digital systems; Hardware; Mass production; Resistors; System testing; Terminology; Voltage; Wiring;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1981.12169
Filename :
1456437
Link To Document :
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