Title :
Frequency markers providing resolution of 1 kHz for sweptmicrowave measurements
Author :
Hoefer, W.J.R. ; Painchaud, G.R.
Author_Institution :
University of Ottawa, Department of Electrical Engineering, Ottawa, Canada
Abstract :
The letter describes a method of generating high-precision frequency markers for swept-microwave measurements, using a spectrum analyser. Narrowband parameters, such as the Q factors of microwave cavities, can be measured with a resolution of 1 kHz.
Keywords :
Q-factor measurement; cavity resonators; microwave measurement; spectral analysers; swept-frequency oscillators; 1KHz; Q factor measurement; cavity resonators; frequency markers; microwave measurement; pulse generators; spectral analysers; swept frequency oscillators;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19740094
