Title :
Computerized Analysis of Burst Noise in Thick Film Resistors
Author :
Cottle, James G. ; Chen, Charles T M
Author_Institution :
University of South Florida, Tampa, FL, USA
fDate :
6/1/1983 12:00:00 AM
Abstract :
A burst noise (popcorn noise) spectral measurement technique based on digital power spectrum estimation is presented. Application of this technique to thick film resistor burst noise is discussed. Several cases of thick film resistor burst noise are presented and analyzed.
Keywords :
Measurement noise; Noise measurement; Spectral analysis; Thick-film circuit measurements; Thick-film circuit noise; Thick-film resistors; Fluctuations; Frequency; Low-frequency noise; Measurement techniques; Noise level; Noise measurement; Pulse measurements; Resistors; Spectral analysis; Thick films;
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCHMT.1983.1136172
