• DocumentCode
    964650
  • Title

    Evaluation method of device noise figure and gain through noise measurements

  • Author

    Sawayama, Yoshihiko ; Mishima, Katsuhiko

  • Author_Institution
    Toshiba Corporation, Kawasaki, Japan
  • Volume
    69
  • Issue
    12
  • fYear
    1981
  • Firstpage
    1578
  • Lastpage
    1579
  • Abstract
    A new method of evaluating the noise figure and available gain of a linear two-port device only from noise measurements is proposed. In this method, there is no need for tuning at the output port of a device under test (DUT) by the use of an excess noise injection through a circulator to the device output port. Hence it gives a much simplified procedure and an improvement of accuracy.
  • Keywords
    Admittance; Attenuators; Circuit noise; Equivalent circuits; Gain measurement; Insertion loss; Noise figure; Noise measurement; Signal to noise ratio; System testing;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1981.12205
  • Filename
    1456473