DocumentCode
964650
Title
Evaluation method of device noise figure and gain through noise measurements
Author
Sawayama, Yoshihiko ; Mishima, Katsuhiko
Author_Institution
Toshiba Corporation, Kawasaki, Japan
Volume
69
Issue
12
fYear
1981
Firstpage
1578
Lastpage
1579
Abstract
A new method of evaluating the noise figure and available gain of a linear two-port device only from noise measurements is proposed. In this method, there is no need for tuning at the output port of a device under test (DUT) by the use of an excess noise injection through a circulator to the device output port. Hence it gives a much simplified procedure and an improvement of accuracy.
Keywords
Admittance; Attenuators; Circuit noise; Equivalent circuits; Gain measurement; Insertion loss; Noise figure; Noise measurement; Signal to noise ratio; System testing;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1981.12205
Filename
1456473
Link To Document