DocumentCode :
964674
Title :
Reliability of low-cost CdS/Cu2S solar cells
Author :
Sayed, M.M. ; Partain, L.D.
Author_Institution :
Hewlett-Packard Co., Microwave Division, Palo Alto, USA
Volume :
10
Issue :
9
fYear :
1974
Firstpage :
163
Lastpage :
164
Abstract :
Accelerated life tests show that CdS/Cu2S solar-cell lifetimes increase with lower temperature, cyclic light and a nitrogen-gas ambient. A normal Arrhenius type of temperature dependence was found. Extrapolated lifetime for cells kept below 50°C in nitrogen gas with earth deployment exceeded twenty years. The probable decay mechanisms are thermal diffusion, formation of recombination centres and voltage-induced decomposition.
Keywords :
reliability; semiconductor device testing; solar cells; CdS; Cu2S; life tests; reliability; semiconductor device testing; solar cells; thermal diffusion; voltage induced decomposition;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19740123
Filename :
4245081
Link To Document :
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