Title :
Fault location and diagnosis procedure in ring-sum iterative arrays
Author_Institution :
Secrétariat ELEC, Louvain-la-Neuve, Belgium
Abstract :
Systematic procedures to detect, locate and disgnose all single-cell failures in rectangular iterative arrays are presented. The maximum number of diagnosis tests, c+5, is linear with the number of columns c of the array. The used cells are of the ring-sum type.
Keywords :
cellular arrays; fault tolerant computing; cellular arrays; fault location; fault tolerant computing; ring sum iterative array;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19740149
