DocumentCode
964993
Title
Simple method of m.o.s.-transistor threshold-voltage measurement
Author
Marciniak, W. ; Rusek, Michal
Author_Institution
Polish Academy of Science, Warsaw, Poland
Volume
10
Issue
10
fYear
1974
Firstpage
202
Lastpage
204
Abstract
A method of m.o.s.-transistor threshold-voltage measurement is described. The method is based on the measurement of the time interval between the pulse that releases the linear voltage ramp applied to the transistor gate, and the pulse of the transient current resulting from the channel formation. This method is particularly useful for investigation of threshold-voltage instabilities.
Keywords
field effect transistors; voltage measurement; MOST; field effect transistor; threshold voltage; voltage measurement;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19740153
Filename
4245112
Link To Document