DocumentCode
965151
Title
Measuring Surface Roughness Height to Parameterize Radar Backscatter Models for Retrieval of Surface Soil Moisture
Author
Bryant, R. ; Moran, M.S. ; Thoma, D.P. ; Collins, C. D Holifield ; Skirvin, S. ; Rahman, M. ; Slocum, K. ; Starks, P. ; Bosch, D. ; Dugo, M. P González
Author_Institution
Dept. of Agric. ARS Southwest Watershed Res. Center, Tucson, AZ
Volume
4
Issue
1
fYear
2007
Firstpage
137
Lastpage
141
Abstract
Surface roughness is a crucial input for radar backscatter models. Roughness measurements of root mean-squared height (hrms) of the same surface can vary depending on the measuring instrument and how the data are processed. This letter addresses the error in hrms associated with instrument bias and instrument deployment issues such as number and length of measurement transects. It was found that at least 20 transect measurements, 3 m in length, for study sites ranging from 3.5 to 1225 m2 in size were necessary to get a consistent hrms measurement. Also, roughness heights of longer transect lengths were highly dependent on the method of detrending the transects. Finally, soil moisture was predicted by inverting the integral equation model using roughness heights taking into account instrument bias, number of measurements, and the detrending method. For common configurations of the Radarsat sensor and reasonable hrms values, error associated with measurement of hrms generally exceeded plusmn20% of soil-moisture prediction
Keywords
backscatter; geomorphology; hydrological techniques; hydrology; soil; Radarsat sensor; radar backscatter models; surface roughness height; surface soil moisture; Backscatter; Instruments; Length measurement; Moisture measurement; Radar measurements; Rough surfaces; Size measurement; Soil measurements; Surface roughness; Surface soil; Integral equation model (IEM); laser radar; modeling; pinmeter; radar imaging; rough surfaces; roughness measurement; soil moisture measurement;
fLanguage
English
Journal_Title
Geoscience and Remote Sensing Letters, IEEE
Publisher
ieee
ISSN
1545-598X
Type
jour
DOI
10.1109/LGRS.2006.887146
Filename
4063280
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