Title :
Increasing Integrated Circuit Product Reliability Through Failure Analysis: The Role of the Independent Laboratory
Author_Institution :
GARD,INC.,Niles,IL
fDate :
3/1/1977 12:00:00 AM
Keywords :
Integrated circuit reliability; Circuit faults; Circuit testing; Costs; Failure analysis; Integrated circuit reliability; Integrated circuit testing; Laboratories; Packaging; Scanning electron microscopy; Semiconductor device manufacture;
Journal_Title :
Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TMFT.1977.1136227
