• DocumentCode
    965155
  • Title

    Increasing Integrated Circuit Product Reliability Through Failure Analysis: The Role of the Independent Laboratory

  • Author

    Edfors, H.C.

  • Author_Institution
    GARD,INC.,Niles,IL
  • Volume
    6
  • Issue
    1
  • fYear
    1977
  • fDate
    3/1/1977 12:00:00 AM
  • Firstpage
    7
  • Lastpage
    8
  • Keywords
    Integrated circuit reliability; Circuit faults; Circuit testing; Costs; Failure analysis; Integrated circuit reliability; Integrated circuit testing; Laboratories; Packaging; Scanning electron microscopy; Semiconductor device manufacture;
  • fLanguage
    English
  • Journal_Title
    Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0046-838X
  • Type

    jour

  • DOI
    10.1109/TMFT.1977.1136227
  • Filename
    1136227
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=965155