Title :
Circuit diagnosis and Thevenin equivalents
Author_Institution :
University of Wisconsin, Platteville, WI
Abstract :
Roytman and Swamy have used the properties of orthonormal excitations to establish one method of circuit diagnosis. In this letter the method is extended to determine the driving-point or Thevenin equivalent impedance for each node pair.
Keywords :
Admittance; Circuit testing; Circuit topology; Digital integrated circuits; Frequency; Impedance; Linear circuits; Network topology; Phase locked loops; Voltage measurement;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1982.12264
