DocumentCode :
965238
Title :
Reducing In-Circuit Testing Costs with Self-Correcting Program Generations
Author :
Borrelli, Ronald N.
Author_Institution :
Zehntel, Inc.Concord,CA
Volume :
6
Issue :
3
fYear :
1977
fDate :
9/1/1977 12:00:00 AM
Firstpage :
61
Lastpage :
63
Keywords :
Automatic testing; Printed circuits; Production testing; Assembly; Automatic testing; Circuit testing; Costs; Debugging; Inspection; Printed circuits; Programming profession; Software testing; System testing;
fLanguage :
English
Journal_Title :
Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0046-838X
Type :
jour
DOI :
10.1109/TMFT.1977.1136235
Filename :
1136235
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=965238
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