Title :
Microprocessor Boards and Automatic Testers
Author_Institution :
Fluke Trendar Corporation,Mt. View,CA
fDate :
9/1/1977 12:00:00 AM
Keywords :
Automatic testing; Computer testing; Microprocessors; Printed circuits; Automatic testing; Circuit testing; Control systems; Large scale integration; Logic testing; Manufacturing; Microprocessors; PROM; Read only memory; System testing;
Journal_Title :
Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TMFT.1977.1136236