Title :
Selecting Test Patterns for 4K RAMS
Author_Institution :
Macrodata Corp.,Woodland Hills, CA
fDate :
9/1/1977 12:00:00 AM
Abstract :
The selection of 4K RAM test patterns for use in a Go/NoGo or characterization type test program requires consideration of several areas related to test program quality. Among all others, two of the most important of these areas are pattern execution time and failure modes tested for. The most popular test patterns for 4K RAM´S are graphically illustrated with step-by-step instructions on test pattern generation provided.
Keywords :
Automatic testing; Computer testing; Production testing; Random-access memories; Circuit faults; Decoding; Electronics industry; Logic devices; Random access memory; Read-write memory; Semiconductor device testing; Test pattern generators; Voltage; Writing;
Journal_Title :
Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TMFT.1977.1136237
