DocumentCode
965455
Title
Localized Auger Recombination in Quantum-Dot Lasers
Author
Blood, Peter ; Pask, Helen ; Summers, Huw D. ; Sandall, Ian
Author_Institution
Cardiff Univ., Cardiff
Volume
43
Issue
12
fYear
2007
Firstpage
1140
Lastpage
1146
Abstract
We have calculated radiative and Auger recombination rates due to localized recombination in individual dots, for an ensemble of 106 dots with carriers occupying the inhomogeneous distribution of energy states according to global Fermi-Dirac statistics. The recombination rates cannot be represented by simple power laws, though the Auger rate has a stronger dependence on the ensemble electron population than radiative recombination. Using single-dot recombination probabilities which are independent of temperature, the ensemble recombination rates and modal gain decrease with increasing temperature at fixed population. The net effect is that the threshold current density increases with increasing temperature due to the increase in threshold carrier density. The most significant consequence of these effects is that the temperature dependence of the Auger recombination rate at threshold is much weaker than in quantum wells, being characterized by a T0 value of about 325 K. Observations of a strong temperature dependence of threshold in quantum dot lasers may have explanations other than Auger recombination, such as recombination from higher lying states, or carrier leakage.
Keywords
Auger effect; current density; electron-hole recombination; energy states; fermion systems; quantum dot lasers; quantum statistical mechanics; Auger recombination; energy states; global Fermi-Dirac statistics; localized recombination; modal gain; quantum-dot lasers; radiative recombination; threshold carrier density; threshold current density; Electrons; Energy states; Probability; Quantum dot lasers; Radiative recombination; Spontaneous emission; Statistical distributions; Temperature dependence; Temperature distribution; Threshold current; Auger recombination; quantum-dot lasers; recom bination proceses; temperature-dependence of threshold current;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.2007.907541
Filename
4376269
Link To Document