DocumentCode :
965560
Title :
Seeing double
Author :
Mack, Chris A.
Volume :
45
Issue :
11
fYear :
2008
fDate :
11/1/2008 12:00:00 AM
Firstpage :
46
Lastpage :
51
Abstract :
This paper discusses double patterning lithography for chips´ manufacture. This technique was first demonstrated by Belgium´s Interuniversity Microelectronics Centre (IMEC) for the 32-nm node, using a combination of double-patterning and immersion lithography. Conceptually, it´s simple: instead of exposing the photoresist layer once under one photomask, as in conventional optical lithography, this technique exposes it twice.
Keywords :
masks; nanopatterning; photolithography; chip manufacture; double patterning lithography; immersion lithography; optical lithography; photomask; photoresist layer; size 32 nm; Lithography; Microelectronics; Pulp manufacturing; Resists;
fLanguage :
English
Journal_Title :
Spectrum, IEEE
Publisher :
ieee
ISSN :
0018-9235
Type :
jour
DOI :
10.1109/MSPEC.2008.4659384
Filename :
4659384
Link To Document :
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