DocumentCode :
965709
Title :
Formation of Self-Assembled Sidewall Nanowires on Shallow Patterned GaAs (100)
Author :
Lee, Jihoon ; Wang, Zhiming ; Liang, Baolai ; Black, William ; Kunets, Vasyl P. ; Mazur, Yuriy ; Salamo, Gregory J.
Author_Institution :
Dept. of Phys., Arkansas Univ., Fayetteville, AR
Volume :
6
Issue :
1
fYear :
2007
Firstpage :
70
Lastpage :
74
Abstract :
The formation of "sidewall nanowires" on shallow patterned mesa strips with a modulation depth of only 35 nm on GaAs (100) was demonstrated using molecular beam epitaxy. While self-assembled GaAs sidewall nanowire formation is observed near mesa strips running along [011], relatively thinner AlAs/GaAs layers are formed on identical mesa strips running along [01-1]. Cross-sectional atomic force microscopy (XAFM) on (011) and (01-1) and AFM on (100) are used to understand the formation of the different morphology of the nanostructures, depending on the direction of the mesas. The data indicates that anisotropic surface diffusion of adatoms, resulting from the characteristic (2times4) GaAs (100) surface reconstruction, is responsible for the sidewall nanowire formation and for the different morphology observed along different directions
Keywords :
III-V semiconductors; adsorbed layers; aluminium compounds; atomic force microscopy; gallium arsenide; molecular beam epitaxial growth; nanowires; self-assembly; semiconductor quantum wires; surface diffusion; surface reconstruction; (2times4) GaAs (100) surface reconstruction; AlAs-GaAs; GaAs; XAFM; adatoms; anisotropic surface diffusion; cross-sectional atomic force microscopy; molecular beam epitaxy; nanostructures; self-assembled sidewall nanowires; shallow patterned mesa strips; Atomic force microscopy; Atomic layer deposition; Gallium arsenide; Molecular beam epitaxial growth; Nanowires; Optical modulation; Self-assembly; Strips; Surface morphology; Surface reconstruction; Atomic force microscopy (AFM); GaAs (100); GaAs quantum wires; molecular beam epitaxy (MBE);
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2006.886774
Filename :
4063335
Link To Document :
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