Title :
Lucky drift estimation of excess noise factor for conventional avalanche photodiodes including the dead space effect
Author :
Marsland, John S. ; Woods, R.C. ; Brownhill, C.A.
Author_Institution :
Dept. of Electr. Eng. & Electron., Liverpool Univ., UK
fDate :
5/1/1992 12:00:00 AM
Abstract :
A technique for estimating the excess noise factor in conventional avalanche photodiodes has been developed. It is based upon a computer simulation of carrier motion using the lucky drift concept. The importance of the impact ionization dead space is demonstrated, and an established theory is shown to overestimate the excess noise factor due to the neglect of the dead space phenomenon in conventional avalanche photodiodes
Keywords :
avalanche photodiodes; electron device noise; semiconductor device models; ADP; avalanche photodiodes; carrier motion; computer simulation; dead space effect; dead space phenomenon; excess noise factor; impact ionization dead space; lucky drift concept; lucky drift estimation; Avalanche photodiodes; Charge carrier processes; Computer simulation; Diodes; Extraterrestrial phenomena; Impact ionization; Integral equations; Noise reduction; Optical noise; Signal to noise ratio;
Journal_Title :
Electron Devices, IEEE Transactions on
