DocumentCode
965715
Title
Lucky drift estimation of excess noise factor for conventional avalanche photodiodes including the dead space effect
Author
Marsland, John S. ; Woods, R.C. ; Brownhill, C.A.
Author_Institution
Dept. of Electr. Eng. & Electron., Liverpool Univ., UK
Volume
39
Issue
5
fYear
1992
fDate
5/1/1992 12:00:00 AM
Firstpage
1129
Lastpage
1135
Abstract
A technique for estimating the excess noise factor in conventional avalanche photodiodes has been developed. It is based upon a computer simulation of carrier motion using the lucky drift concept. The importance of the impact ionization dead space is demonstrated, and an established theory is shown to overestimate the excess noise factor due to the neglect of the dead space phenomenon in conventional avalanche photodiodes
Keywords
avalanche photodiodes; electron device noise; semiconductor device models; ADP; avalanche photodiodes; carrier motion; computer simulation; dead space effect; dead space phenomenon; excess noise factor; impact ionization dead space; lucky drift concept; lucky drift estimation; Avalanche photodiodes; Charge carrier processes; Computer simulation; Diodes; Extraterrestrial phenomena; Impact ionization; Integral equations; Noise reduction; Optical noise; Signal to noise ratio;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.129093
Filename
129093
Link To Document