• DocumentCode
    965889
  • Title

    Some Rating and Application Considerations for Silicon Diodes

  • Author

    Lin, H.C.

  • Author_Institution
    Univ of maryland,MD.
  • Volume
    6
  • Issue
    4
  • fYear
    1959
  • fDate
    12/1/1959 12:00:00 AM
  • Firstpage
    269
  • Lastpage
    273
  • Abstract
    The dissipation in a silicon rectifier depends on the characteristics of the rectifier (threshold voltage and ohmic resistance) and the circuit constants (inductive, resistive, or capacitive load). Dissipations under these different conditions are calculated. The maximum permissible dissipation is limited by maximum junction temperature and thermal stability. The stability criterion depends on the thermal resistance, the reverse characteristic and its change with respect to temperature, the reverse voltage, and the circuit configuration. Derating curves are obtained, based on known variations of the reverse characteristics of silicon rectifiers with temperature and voltage. The maximum permissible transient dissipation depends on the total surge energy. The energy dissipated in the rectifier is high when the load capacitance is high and the external series resistance is low. A design embodying all the foregoing considerations is illustrated.
  • Keywords
    Circuit stability; Diodes; Rectifiers; Silicon; Stability criteria; Surges; Temperature dependence; Thermal resistance; Thermal stability; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Component Parts, IRE Transactions on
  • Publisher
    ieee
  • ISSN
    0096-2422
  • Type

    jour

  • DOI
    10.1109/TCP.1959.1136296
  • Filename
    1136296