DocumentCode
965889
Title
Some Rating and Application Considerations for Silicon Diodes
Author
Lin, H.C.
Author_Institution
Univ of maryland,MD.
Volume
6
Issue
4
fYear
1959
fDate
12/1/1959 12:00:00 AM
Firstpage
269
Lastpage
273
Abstract
The dissipation in a silicon rectifier depends on the characteristics of the rectifier (threshold voltage and ohmic resistance) and the circuit constants (inductive, resistive, or capacitive load). Dissipations under these different conditions are calculated. The maximum permissible dissipation is limited by maximum junction temperature and thermal stability. The stability criterion depends on the thermal resistance, the reverse characteristic and its change with respect to temperature, the reverse voltage, and the circuit configuration. Derating curves are obtained, based on known variations of the reverse characteristics of silicon rectifiers with temperature and voltage. The maximum permissible transient dissipation depends on the total surge energy. The energy dissipated in the rectifier is high when the load capacitance is high and the external series resistance is low. A design embodying all the foregoing considerations is illustrated.
Keywords
Circuit stability; Diodes; Rectifiers; Silicon; Stability criteria; Surges; Temperature dependence; Thermal resistance; Thermal stability; Threshold voltage;
fLanguage
English
Journal_Title
Component Parts, IRE Transactions on
Publisher
ieee
ISSN
0096-2422
Type
jour
DOI
10.1109/TCP.1959.1136296
Filename
1136296
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