Title :
A Dynamic Measurement Technique for Third-Order Distortion in Optical Phase Modulators
Author :
Sysak, Matthew N. ; Johansson, Leif ; Klamkin, Jonathan S. ; Coldren, Larry A. ; Bowers, John E.
Author_Institution :
Dept. of Electr. Eng., California Univ., Santa Barbara, CA
Abstract :
A novel two-tone measurement technique for characterizing distortion in optical phase modulators is proposed and demonstrated. The technique is used to characterize an InGaAsP-InP modulator in a monolithically integrated receiver. Results for forward and reverse bias conditions in the modulator show a phase IP3 of 7.2pi and 0.97pi rad, respectively
Keywords :
III-V semiconductors; gallium arsenide; indium compounds; optical communication equipment; optical distortion; optical modulation; semiconductor device measurement; InGaAsP-InP; InGaAsP-InP modulator; monolithically integrated receiver; optical phase modulators; third-order dispersion; two-tone measurement; Measurement techniques; Optical distortion; Optical filters; Optical interferometry; Optical modulation; Optical receivers; Optical transmitters; Phase distortion; Phase modulation; Testing; Carrier injection; phase distortion; phase modulators; quantum confined stark effect;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2006.890026
