DocumentCode :
966133
Title :
Computer Aided Design for Large-Scale Integrated Circuits
Author :
Lynn, D.K.
Volume :
5
Issue :
3
fYear :
1972
Firstpage :
36
Lastpage :
45
Abstract :
The complexity of integrated circuits has increased steadily over the past several years from circuits consisting of simple gates through Medium Scale Integration (MSI) and Large Scale Integration (LSI). Fabrication techniques for LSI have evolved from well-established integrated circuit technology. Because of the large physical size and the large number of components on the individual silicon die, production techniques have been substantially improved in order to maintain reasonable yields. However, the most significant effects of LSI on the semiconductor manufacturer are in the areas of design and testing; techniques used in the past for simpler integrated circuits are inadequate for LSI.
Keywords :
Circuit testing; Fabrication; Integrated circuit manufacture; Integrated circuit technology; Integrated circuit testing; Integrated circuit yield; Large scale integration; Production; Semiconductor device manufacture; Silicon;
fLanguage :
English
Journal_Title :
Computer
Publisher :
ieee
ISSN :
0018-9162
Type :
jour
DOI :
10.1109/C-M.1972.216915
Filename :
1641549
Link To Document :
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