• DocumentCode
    966136
  • Title

    Detection and Accelerated Testing of Vibration-Induced Connector Wear

  • Author

    Blanks, Henry S.

  • Author_Institution
    Univ. of New South Wales,Densington, Australia
  • Volume
    7
  • Issue
    1
  • fYear
    1984
  • fDate
    3/1/1984 12:00:00 AM
  • Firstpage
    3
  • Lastpage
    10
  • Abstract
    Voltage drop and contact resistance, especially when the connector is at rest, are very insensitive to vibration-induced plating damage in connectors. The spectral analysis of the voltage drop, while the two members of the connector are undergoing relative sinusoidai micromotion and passing dc current, provides much more sensitive detection of wear and information about its extent. Monitoring the spectral content while inGreasing the vibration amplitude linearly with time is a potentially useful accelerated vibration life-test, although its quantitative application to the prediction of connector life for other vibration profiles is still uncertain. Gold-plated, tin-plated, and rhodium-plated printed circuit board edgecontacts, mating with commercial gold-plated socket contacts, have been investigated, with vibration parallel to the board fingers.
  • Keywords
    Component reliability; Connectors; Mechanical factors; Spectral analysis; Acceleration; Connectors; Contact resistance; Fingers; Life estimation; Monitoring; Printed circuits; Sockets; Spectral analysis; Voltage;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1984.1136320
  • Filename
    1136320