DocumentCode :
966257
Title :
Formal tilt invariance of the nonlocal curvature approximation and its connection to the integral equation method
Author :
Elfouhaily, T. ; Guignard, S. ; Thompson, D.R.
Author_Institution :
Inst. de Recherche sur les Phenomenes Hors Equilibre, CNRS, Marseille, France
Volume :
1
Issue :
2
fYear :
2004
fDate :
4/1/2004 12:00:00 AM
Firstpage :
51
Lastpage :
56
Abstract :
Tilt invariance is a stringent constraint that second-order scattering models such as the integral equation method (IEM) should satisfy in order to expand their domain of applicability. Moreover, second-order scattering models must reproduce elementary limits such as the small perturbation method (SPM) and the high-frequency Kirchhoff approximation. Tilt invariance is met if and only if a scattering model yields the same asymptotic limit whether the scattering surface is tilted before or after the limiting process. In particular, the tilted SPM coefficients are well determined by simply tilting the reference frame. If it is tilt invariant, a second-order scattering model will reproduce these tilted coefficients by simply tilting the surface explicitly present in the expression of the scattering model before reducing it to the SPM limit. In this letter, we demonstrate that our nonlocal curvature approximation (NLCA) is formally tilt invariant up to first order in the tilting vector. Satisfying the tilt invariance property can extend the applicability of scattering models to account, for example, for scattering from multiscale surfaces and polarization mixing due to out-of-plane tilting. It is also suggested that replacing the field coefficients of IEM by the curvature kernel of NLCA introduces a promising alternative technique that includes multiple scattering up to double reflections from the rough surface, while remaining analytically compact and formally tilt invariant.
Keywords :
electromagnetic wave scattering; geophysics; integral equations; remote sensing; rough surfaces; Kirchhoff approximation; SPM; curvature kernel; double reflections; integral equation method; multiple scattering; nonlocal curvature approximation; polarization; reference frame; rough surface; scattering model; scattering surface; second-order scattering model; second-order scattering models; small perturbation method; tilt invariance; Integral equations; Kernel; Kirchhoff´s Law; Perturbation methods; Polarization; Reflection; Rough surfaces; Scanning probe microscopy; Scattering; Surface roughness;
fLanguage :
English
Journal_Title :
Geoscience and Remote Sensing Letters, IEEE
Publisher :
ieee
ISSN :
1545-598X
Type :
jour
DOI :
10.1109/LGRS.2004.823454
Filename :
1291380
Link To Document :
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