• DocumentCode
    966355
  • Title

    Test and evaluation of bubble memories

  • Author

    Bahm, Edmund

  • Author_Institution
    California Institue of Technology, Pasadena, California, USA
  • Volume
    14
  • Issue
    5
  • fYear
    1978
  • fDate
    9/1/1978 12:00:00 AM
  • Firstpage
    300
  • Lastpage
    302
  • Abstract
    Since January, 1977, a test and evaluation program has been conducted at the Jet Propulsion Laboratory to determine the potential usefulness of bubble memories for spacecraft and commercial applications. The memories evaluated were commercially available units which are similar to a NASA-developed memory cell. It is planned to also test other memories as they become available from manufacturers. Objectives of the test program were to determine: (1) Long-term stability of memory performance. (2) Margins of power supply voltages and bias field. (3) Data pattern sensitivity. (4) Memory performance over specified temperature range. (5) Memory performance in vacuum. The memory was found to operate reliably over long periods of time. No aging or wear-out was detected during one year of operation. Margins of power supply voltages and bias field were acceptable, but quite narrow at the low end of the temperature range. In addition, the error rate was found to be strongly data-pattern sensitive. The error rate of one memory improved considerably if it was operated continuously for long periods of time. The other memory did not show this characteristic. With the evaluated memories comparing favorably with other mass memories, such as tape recorders, bubble memories are now considered viable candidates for future spacecraft applications.
  • Keywords
    Magnetic bubble memories; Memory testing; Space-vehicle computers; Aircraft manufacture; Error analysis; Laboratories; Manufacturing; Power supplies; Propulsion; Temperature distribution; Temperature sensors; Testing; Voltage;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1978.1059831
  • Filename
    1059831