Title :
Finite element analysis of the vertical multi-turn thin-film head
Author_Institution :
Memorex Corporation, Santa Clara, California
fDate :
9/1/1978 12:00:00 AM
Abstract :
The equations describing a model of the general case of the vertical thin-film head are solved using finite element analysis. Read efficiency and inductance are computed as a function of head permeability for a variety of design geometries. The effects of pole saturation during write are also treated, and results are presented for a number of cases of interest. From these results a set of guidelines for the geometric design of thin-film heads is developed.
Keywords :
FEM; Finite-element method (FEM); Magnetic recording/reading heads; Boundary conditions; Differential equations; Finite element methods; Inductance; Magnetic flux; Magnetic heads; Magnetic separation; Permeability; Saturation magnetization; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1978.1059836
