• DocumentCode
    966428
  • Title

    The VLSI Package-An Analytical Review

  • Author

    Lewis, Edward T.

  • Author_Institution
    Raytheon Company, Bedford, MA, USA
  • Volume
    7
  • Issue
    2
  • fYear
    1984
  • fDate
    6/1/1984 12:00:00 AM
  • Firstpage
    197
  • Lastpage
    201
  • Abstract
    Current very large-scale integrated (VLSI) chip packaging options, with a special emphasis on the various size and chip I/O complexity issues are reviewed, quantitatively. The two basic packaging options reviewed are the hermetic chip carrier (HCC) and the pin grid array (PGA). The impact that chip input/output (I/O) has on the "size" growth of packages as single chip enclosures, as well as that of the chips themselves, is considered. It is shown that the HCC is inherently more area-efficient for almost any high I/O configured VLSI chip, especially if the chip size growth that must be anticipated is considered as I/O\´s of 400 arc entertained. After quantitative considerations of discrete packaging options are exhausted, it is finally recommended that a multicbip VLSI module should be seriously considered as a more efficient packaging concept. This, however, requires some innovation directed toward the development of adequate prepackaged chip testing. This could be facilitated through the incorporation of physically testable I/O ports on the "passivated" VLSI chip; e.g., flip chip "bumps," tape-automated bonding (TAB), or beam lead chip interconnects.
  • Keywords
    Integrated circuit packaging; VLSI; Very large-scale integration (VLSI); Bonding; Ceramics; Electronics packaging; Integrated circuit interconnections; Pins; Printed circuits; Technological innovation; Testing; Thermal stresses; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1984.1136348
  • Filename
    1136348