Title :
X ray scanning pinhole microscope
Author_Institution :
University of Helsinki, Department of Physics, Helsinki, Finland
Abstract :
A simple absorption-type scanning pinhole X ray microscope is presented. Owing to its simple structure, it may find applications in industrial environments. The resolution is determined by the size of pinholes used.
Keywords :
X-ray apparatus; microscopes; X-ray scanning pinhole microscope; absorption;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19740383
