• DocumentCode
    966498
  • Title

    Estimating the Strength of Annular Glass-to-Metal Seals in Microelectronic Packages: An Experimental Study

  • Author

    Kokini, Klod ; Perkins, Richard W.

  • Author_Institution
    University of Pittsburgh, PA
  • Volume
    7
  • Issue
    3
  • fYear
    1984
  • fDate
    9/1/1984 12:00:00 AM
  • Firstpage
    276
  • Lastpage
    280
  • Abstract
    The resistance of annular glass-to-metal seals, in microelectronic packages, to a sudden change in temperature is tested through the thermal shock test. In order to predict or evaluate the failure of the seal under thermal shock, the strength of the seal has to be known. A lower bound for the strength of such seals is evaluated by subjecting samples made of a circular lead sealed to a TO-8 eyelet through an annular glass seal, to various levels of thermal shock and calculating the corresponding maximum thermal stresses in the glass. This procedure is repeated in four thermal shock test fluids: water, oil, fluorocarbon, and liquid nitrogen. A lower bound of approximately 7600 Ibf/in2is estimated for the strength of the glass-to-metal interface.
  • Keywords
    Glass materials/devices; Integrated circuit packaging; Integrated circuit thermal factors; Mechanical factors; Seals; Electric shock; Glass; Microelectronics; Packaging; Petroleum; Seals; Temperature; Testing; Thermal resistance; Thermal stresses;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1984.1136355
  • Filename
    1136355