DocumentCode :
966498
Title :
Estimating the Strength of Annular Glass-to-Metal Seals in Microelectronic Packages: An Experimental Study
Author :
Kokini, Klod ; Perkins, Richard W.
Author_Institution :
University of Pittsburgh, PA
Volume :
7
Issue :
3
fYear :
1984
fDate :
9/1/1984 12:00:00 AM
Firstpage :
276
Lastpage :
280
Abstract :
The resistance of annular glass-to-metal seals, in microelectronic packages, to a sudden change in temperature is tested through the thermal shock test. In order to predict or evaluate the failure of the seal under thermal shock, the strength of the seal has to be known. A lower bound for the strength of such seals is evaluated by subjecting samples made of a circular lead sealed to a TO-8 eyelet through an annular glass seal, to various levels of thermal shock and calculating the corresponding maximum thermal stresses in the glass. This procedure is repeated in four thermal shock test fluids: water, oil, fluorocarbon, and liquid nitrogen. A lower bound of approximately 7600 Ibf/in2is estimated for the strength of the glass-to-metal interface.
Keywords :
Glass materials/devices; Integrated circuit packaging; Integrated circuit thermal factors; Mechanical factors; Seals; Electric shock; Glass; Microelectronics; Packaging; Petroleum; Seals; Temperature; Testing; Thermal resistance; Thermal stresses;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/TCHMT.1984.1136355
Filename :
1136355
Link To Document :
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