DocumentCode
966498
Title
Estimating the Strength of Annular Glass-to-Metal Seals in Microelectronic Packages: An Experimental Study
Author
Kokini, Klod ; Perkins, Richard W.
Author_Institution
University of Pittsburgh, PA
Volume
7
Issue
3
fYear
1984
fDate
9/1/1984 12:00:00 AM
Firstpage
276
Lastpage
280
Abstract
The resistance of annular glass-to-metal seals, in microelectronic packages, to a sudden change in temperature is tested through the thermal shock test. In order to predict or evaluate the failure of the seal under thermal shock, the strength of the seal has to be known. A lower bound for the strength of such seals is evaluated by subjecting samples made of a circular lead sealed to a TO-8 eyelet through an annular glass seal, to various levels of thermal shock and calculating the corresponding maximum thermal stresses in the glass. This procedure is repeated in four thermal shock test fluids: water, oil, fluorocarbon, and liquid nitrogen. A lower bound of approximately 7600 Ibf/in2is estimated for the strength of the glass-to-metal interface.
Keywords
Glass materials/devices; Integrated circuit packaging; Integrated circuit thermal factors; Mechanical factors; Seals; Electric shock; Glass; Microelectronics; Packaging; Petroleum; Seals; Temperature; Testing; Thermal resistance; Thermal stresses;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/TCHMT.1984.1136355
Filename
1136355
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