DocumentCode :
966758
Title :
Reliable low-power digital signal processing via reduced precision redundancy
Author :
Shim, Byonghyo ; Sridhara, Srinivasa R. ; Shanbhag, Naresh R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois, Urbana, IL, USA
Volume :
12
Issue :
5
fYear :
2004
fDate :
5/1/2004 12:00:00 AM
Firstpage :
497
Lastpage :
510
Abstract :
In this paper, we present a novel algorithmic noise-tolerance (ANT) technique referred to as reduced precision redundancy (RPR). RPR requires a reduced precision replica whose output can be employed as the corrected output in case the original system computes erroneously. When combined with voltage overscaling (VOS), the resulting soft digital signal processing system achieves up to 60% and 44% energy savings with no loss in the signal-to-noise ratio (SNR) for receive filtering in a QPSK system and the butterfly of fast Fourier transform (FFT) in a WLAN OFDM system, respectively. These energy savings are with respect to optimally scaled (i.e., the supply voltage equals the critical voltage V/sub dd-crit/) present day systems. Further, we show that the RPR technique is able to maintain the output SNR for error rates of up to 0.09/sample and 0.06/sample in an finite impulse response filter and a FFT block, respectively.
Keywords :
CMOS digital integrated circuits; digital signal processing chips; fast Fourier transforms; integrated circuit noise; integrated circuit reliability; low-power electronics; quadrature phase shift keying; redundancy; CMOS; FFT; WLAN OFDM system; algorithmic noise-tolerance; digital signal processing; fast Fourier transform; reduced precision redundancy; reliable low power digital signal processing; signal-to-noise ratio; voltage overscaling; Digital filters; Digital signal processing; Fast Fourier transforms; Filtering; Noise reduction; Quadrature phase shift keying; Redundancy; Signal processing algorithms; Signal to noise ratio; Voltage;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2004.826201
Filename :
1291428
Link To Document :
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