DocumentCode :
966808
Title :
Development of a Novel Resistor System for Nitrogen Firing Applications
Author :
Hankey, Dana L. ; Fisher, Clark K.
Author_Institution :
Heraeus Cermalloy Inc., West Conshohocken, PA
Volume :
7
Issue :
4
fYear :
1984
fDate :
12/1/1984 12:00:00 AM
Firstpage :
417
Lastpage :
422
Abstract :
A novel resistor system compatible with both a copper conductor and a low K dielectric formulation has been under development as a result of an increased interest in such a system. In this paper, which is essentially a current progress report, the capabilities of this system as they have progressed to date are defined. A processing study addressing the effect of peak firing temperature on resultant resistor properties yielded superior performance at 850°C. The properties monitored include sheet resistivity, hot and cold TCR, \\Delta TCR, VCR, and aspect ratio tracking. Laser trim drift data and long term drift data as a function of elevated temperature and humidity are presented for unencapsulated and encapsulated trimmed resistors. Topographic and cross-sectional microstructural features of this system were studied using backscattered electron imaging (BEI) with a scanning electron microscope (SEM) and X-ray microanalysis (XRM).
Keywords :
Thick-film resistors; Conductivity; Conductors; Copper; Dielectrics; Firing; Monitoring; Nitrogen; Resistors; Scanning electron microscopy; Temperature;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/TCHMT.1984.1136383
Filename :
1136383
Link To Document :
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