Title :
A Mechanical, Electrical, Thermal Coupled-Field Simulation of a Sphere-Plane Electrical Contact
Author :
Monnier, Arnaud ; Froidurot, B. ; Jarrige, C. ; Teste, Philippe ; Meyer, R.
Author_Institution :
Lab. de Genie Electrique de Paris, Gif-Sur-Yvette
Abstract :
The purpose of this paper is to present a numerical simulation of the behavior of a sphere-plane electrical contact when a high current flows through it. A sequential coupling allows to study the interactions between mechanical, electrical and thermal phenomena occurring under a high current flow (intensity between 20 and 60 kA). The structural deformations and the voltage and temperature distributions are computed with the help of the finite element method via the ANSYS software. The 2D axisymmetric geometry considers a smooth sphere pressed on a smooth plane. The model takes into account the temperature dependency of material properties such as Young´s modulus, hardness, electrical and thermal conductivities, specific heat, and coefficient of thermal expansion. The influence of the current intensity, the contact force, and the duration of the current flow on the potential distribution has been studied. As they are coupled, all phenomena are affected by heat generation variations and every phenomenon has an effect on all others and so on. In some particular conditions, analytical calculations make it possible to validate the simulation. Comparisons with experimental results are realized with several contact forces.
Keywords :
Young´s modulus; electrical conductivity; electrical contacts; finite element analysis; temperature distribution; thermal conductivity; thermal expansion; 2D axisymmetric geometry; ANSYS software; Young modulus; contact force; current 20 kA to 60 kA; current flow duration; current intensity; electrical conductivity; electrical coupled-field simulation; finite element method; heat generation variations; material properties; mechanical coupled-field simulation; oxygen free high conductivity; sequential coupling; specific heat; sphere-plane electrical contact; structural deformations; temperature distribution; thermal conductivity; thermal coupled-field simulation; thermal expansion coefficient; voltage distribution; Contacts; Couplings; Distributed computing; Finite element methods; Geometry; Numerical simulation; Temperature distribution; Thermal conductivity; Thermal expansion; Voltage; Ag; electrical contact; oxygen free high conductivity (OFHC) Cu; simulation; sphere-plane;
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
DOI :
10.1109/TCAPT.2007.906288