Title :
Performance of Cavity-Parametric Amplifiers, Employing Kerr Nonlinearites, in the Presence of Two-Photon Loss
Author :
Yurke, Bernard ; Buks, Eyal
Author_Institution :
Lucent Technol. Bell Labs., Murray Hill, NJ
Abstract :
Two-photon loss mechanisms often accompany a Kerr nonlinearity. The kinetic inductance exhibited by superconducting transmission lines provides an example of a Kerr-like nonlinearity that is accompanied by a nonlinear resistance of the two-photon absorptive type. Such nonlinear dissipation can degrade the performance of amplifiers and mixers employing a Kerr-like nonlinearity as the gain or mixing medium. As an aid for parametric-amplifier design, the authors provide a quantum analysis of a cavity parametric amplifier employing a Kerr nonlinearity that is accompanied by a two-photon absorptive loss. Because of their usefulness in diagnostics, we obtain expressions for the pump amplitude within the cavity, the reflection coefficient for the pump amplitude reflected off of the cavity, the parametric gain, and the intermodulation gain. Expressions by which the degree of squeezing can be computed are also presented. Although the focus here is on providing aids for the design of kinetic-inductance parametric amplifiers, much of what is presented is directly applicable to analogous optical and mechanical amplifiers
Keywords :
optical Kerr effect; optical design techniques; optical losses; optical parametric amplifiers; optical squeezing; reflectivity; superconducting transmission lines; two-photon processes; Kerr nonlinearity; cavity parametric amplifiers; intermodulation gain; kinetic inductance; reflection coefficient; squeezing; superconducting transmission lines; two-photon loss; Degradation; Inductance; Kinetic theory; Optical amplifiers; Optical design; Optical reflection; Performance gain; Performance loss; Semiconductor optical amplifiers; Superconducting transmission lines; Kinetic inductance; noise squeezing; nonlinear; parametric amplifier;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2006.884490