DocumentCode :
966947
Title :
Numerical through-resistor (TR) calibration technique for modeling of microwave integrated circuits
Author :
Li, Lin ; Wu, Ke
Author_Institution :
Dept. of Electr. Eng., Ecole Polytechnique de Montreal, Que., Canada
Volume :
14
Issue :
4
fYear :
2004
fDate :
4/1/2004 12:00:00 AM
Firstpage :
139
Lastpage :
141
Abstract :
A through-resistor (TR) calibration procedure is proposed for parameter extraction and accurate modeling of planar discontinuities and circuits by using a full-wave technique such as method of moments (MoM). This new scheme allows the effective use of a commercial electromagnetic field simulator in removing inherent numerical noises or errors in simulation, and making the parameter extraction for circuit models. A microstrip open-end and a microstrip gap are studied and effectiveness of this new scheme is verified.
Keywords :
calibration; equivalent circuits; integrated circuit modelling; method of moments; microstrip discontinuities; microwave integrated circuits; parameter estimation; TR calibration; electromagnetic field simulator; full-wave technique; method of moments; microstrip gap; microstrip open-end; microwave integrated circuits modeling; parameter extraction; planar discontinuities modeling; through-resistor; Calibration; Circuit simulation; Electromagnetic fields; Integrated circuit modeling; Integrated circuit noise; Microstrip; Microwave integrated circuits; Microwave theory and techniques; Moment methods; Parameter extraction;
fLanguage :
English
Journal_Title :
Microwave and Wireless Components Letters, IEEE
Publisher :
ieee
ISSN :
1531-1309
Type :
jour
DOI :
10.1109/LMWC.2003.819375
Filename :
1291443
Link To Document :
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