DocumentCode :
966951
Title :
Semiconductor Part Handling for Automatic Manufacturing and Testing
Author :
Schwarze, Ralph W.
Author_Institution :
Advance Automation Associates
Volume :
7
Issue :
2
fYear :
1963
fDate :
4/1/1963 12:00:00 AM
Firstpage :
28
Lastpage :
31
Keywords :
Automatic testing; Costs; Design automation; Electronic components; Instruments; Manufacturing automation; Product development; Production; Semiconductor device manufacture; Semiconductor device testing;
fLanguage :
English
Journal_Title :
Product Engineering and Production, IEEE Transactions on
Publisher :
ieee
ISSN :
0097-4544
Type :
jour
DOI :
10.1109/TPEP.1963.1136396
Filename :
1136396
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=966951
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