DocumentCode :
967124
Title :
Ultra-High-Voltage Charge Pump Circuit in Low-Voltage Bulk CMOS Processes With Polysilicon Diodes
Author :
Ker, Ming-Dou ; Chen, Shih-Lun
Author_Institution :
Inst. of Electron., Nat. Chiao Tung Univ., Hsinchu
Volume :
54
Issue :
1
fYear :
2007
Firstpage :
47
Lastpage :
51
Abstract :
An on-chip ultra-high-voltage charge pump circuit realized with the polysilicon diodes in the low-voltage bulk CMOS process is proposed in this work. Because the polysilicon diodes are fully isolated from the silicon substrate, the output voltage of the charge pump circuit is not limited by the junction breakdown voltage of MOSFETs. The polysilicon diodes can be implemented in the standard CMOS processes without extra process steps. The proposed ultra-high-voltage charge pump circuit has been fabricated in a 0.25-mum 2.5-V standard CMOS process. The output voltage of the four-stage charge pump circuit with 2.5-V power-supply voltage (VDD=2.5 V) can be pumped up to 28.08 V, which is much higher than the n-well/p-substrate breakdown voltage (~18.9 V) in a 0.25-mum 2.5-V bulk CMOS process
Keywords :
CMOS analogue integrated circuits; MOSFET; elemental semiconductors; semiconductor device breakdown; semiconductor diodes; silicon; voltage multipliers; 0.25 micron; 2.5 V; MOSFET; Si; high-voltage generator; junction breakdown voltage; low-voltage bulk CMOS process; n-well/p-substrate breakdown voltage; polysilicon diodes; silicon substrate; ultra-high-voltage charge pump circuit; Breakdown voltage; CMOS process; Cathodes; Charge pumps; Circuits; MOSFETs; P-n junctions; Semiconductor diodes; Silicon on insulator technology; Substrates; Charge pump circuit; high-voltage generator; polysilicon diode;
fLanguage :
English
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-7747
Type :
jour
DOI :
10.1109/TCSII.2006.882854
Filename :
4063470
Link To Document :
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