DocumentCode
967330
Title
CMOS multiple-valued logic design. II. Function realization
Author
Jain, Atul K. ; Bolton, Ron J. ; Abd-El-Barr, Mostafa H.
Author_Institution
Dept. of Electr. Eng., Saskatchewan Univ., Saskatoon, Sask., Canada
Volume
40
Issue
8
fYear
1993
fDate
8/1/1993 12:00:00 AM
Firstpage
515
Lastpage
522
Abstract
For pt. I see ibid vol. 40, no. 8 p 503-14 (1993). The performance of the set of operators proposed in pt. I is compared with existing sets of operators for the realization of multiple-valued logic (MVL) functions. In pt. I, a set of operators was proposed consisting of literal, cycle, complement of literal, complement of cycle, min, and tsum operators (Set 1). This set of operators is compared to two existing sets of operators consisting of literal, complement of literal, min, and tsum operators (Set 2) and literal, min, and tsum operators (Set 3). For 3-valued 2-variable MVL functions, it is shown that the maximum number of product terms (PTs) required to realize all functions can be reduced to three PTs (using the Set 1 operators) from five PTs (using the Set 2 operators) and six PTs (using the Set 3 operators). In addition, it is shown that the average number of PTs required to realize all the functions reduces to 2.61 (using the Set 1 operators) from 3.19 (using the Set 2 operators) and 3.61 (using the Set 3 operators). It is anticipated that similar improvements are possible for higher valued logic. Realizations of a 4-valued 2-variable function based on different sets of operators are included to support such a claim
Keywords
CMOS integrated circuits; SPICE; circuit CAD; integrated logic circuits; logic CAD; many-valued logics; 3-valued 2-variable MVL functions; 4-valued 2-variable function; CMOS multiple-valued logic; Set 1 operators; Set 2 operators; Set 3 operators; complement of literal operators; function realization; literal operators; logic design; min operators; product terms; tsum operators; Analytical models; CMOS technology; Charge coupled devices; Circuits; Logic design; Microelectronics; Telecommunications; Testing; Transient analysis;
fLanguage
English
Journal_Title
Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
Publisher
ieee
ISSN
1057-7122
Type
jour
DOI
10.1109/81.242321
Filename
242321
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